Design For Testability with Lab (Synopsys Tools)

This course provides an insightful exploration of scan design for testing, also known as Design for Testability (DFT). Learners will gain a comprehensive understanding of the pivotal role DFT Engineers play in every stage of the chip life cycle. Additionally, it offers an introduction to the fundamental concepts of DFT and its necessity.

Scan Insertion without Compression:

Delve into the intricacies of scan insertion for testing or Design for Testability (DFT). Gain a nuanced understanding of the functions of DFT Engineers across various stages of the chip life cycle. This course provides a detailed examination of scan insertion, scan design rules, and elucidates these concepts through relevant examples. Moreover, it offers comprehensive insights into Lockup Latches.