Design for Testability

Welcome to the Design for Testability course – your complete guide to testing methodologies in electronic design. This course takes you through essential topics, starting with an introduction to testing and progressing through hands-on DFT labs. You’ll explore key concepts such as fault collapsing, ATPG, DFT basics, scan insertion, test compression, boundary scan, BIST, and more. Engage in practical labs to solidify your understanding and gain the skills needed to implement effective, testable designs. Join us on this insightful journey into the world of Design for Testability!

Optimize your digital design for testability with Maven Silicon. Discover effective strategies and techniques to implement robust testing processes in VLSI and hardware development.